Failure Analysis Lab

SEM Lab, Inc. provides failure analysis, materials characterization, scanning electron microscopy (SEM) and FTIR services. We specialize in failure analysis of electronic assemblies, printed-circuit-boards (PCBs) or printed-wiring-boards (PWBs), and electronic components such as integrated circuits (ICs), memory chips, transistors, diodes, capacitors, resistors, light emitting diodes (LEDs), power modules, and many others.

Since 1997 we have developed relationships with over 450 client companies including many of the most prominent Fortune 500 electronic, medical and high technology companies in the world, as well as independent consultants and small businesses.

Failure Analysis

  • Metallurgical failure analysis
  • Corrosion problems
  • Structural failure analysis
  • Fracture analysis


Materials Analysis

  • Characterization and analysis of materials (metals, plastics, ceramics, glasses
  • Fourier Transform Infrared Spectroscopy (FTIR)
  • Particle analysis and identification
  • Metallurgical evaluation
  • Microstructural characterization


Electronic Component F/A

  • Device and component failures
  • Electronic assembly analysis
  • Component failure mechanisms
  • PWB construction analysis


SEM/EDS Analysis

  • Zoom magnification up to 50,000X
  • Elemental analysis of C (z=6) to U (z=92)