Scanning Electron Microscopy (SEM) Service

SEM and EDS

Scanning Electron Microscopy (SEM) is an important tool for materials and failure analysis. SEM Lab, Inc. can provide high magnification, high resolution images of samples at magnifications up to 50,000x. Plastics, glasses, or ceramics are commonly examined and require no special coating to be viewed in our SEM. The sample chamber will accept specimens up to 6 in. x 6 in. x 1 in.

Energy Dispersive X-ray analysis (EDS or EDX) can be applied in conjuction with SEM analysis and is a technique used to identify the elemental composition of a sample or small area of interest on the sample. More information about EDS analysis can be found here:

Elemental Analysis (EDS) Service

Determination of termination composition on Multi-Layer Chip Capacitor (MLCC).

Determination of termination composition on Multi-Layer Chip Capacitor (MLCC).

 

EDS analysis of flux residue.

EDS analysis of flux residue.