Bond cratering microsection

Posted on September 4, 2014October 3, 2017 by Ed Hare PhD

Microsection of cratered gold ball bond on silicon die.

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MLCC dielectric porosity

Posted on September 3, 2014October 3, 2017 by Ed Hare PhD

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Diode EOS

Posted on September 2, 2014October 3, 2017 by Ed Hare PhD

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MLCC flaws

Posted on September 2, 2014June 19, 2019 by Ed Hare PhD

Multilayer Chip Capacitor (MLCC) flaws.

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Parylene coating

Posted on September 2, 2014October 3, 2017 by Ed Hare PhD

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Diode EOS

Posted on September 2, 2014October 3, 2017 by Ed Hare PhD

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BGA gas voids

Posted on September 2, 2014October 3, 2017 by Ed Hare PhD

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Distorted BGA

Posted on September 2, 2014March 13, 2023 by Ed Hare PhD

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PLCC bond fail

Posted on September 2, 2014October 3, 2017 by Ed Hare PhD

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Conductive residue

Posted on September 2, 2014October 3, 2017 by Ed Hare PhD

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