Case 1989 ยท Public preview

ENIG Anomalies and Excessive Intermetallic Growth Can Weaken Corner BGA Joints

Additional BGA assemblies exhibited fractured corner solder joints and intermittent board-level failures.

MicrosectioningSEMEDSPry testingIntermetallic measurement
Preview image for Case 1989

What the evidence preview establishes

Corner joints fractured between nickel-tin intermetallic and electroless nickel. Irregular nickel plating, low bulk phosphorus in one assembly, excessive intermetallic thickness, mechanical or thermal-mechanical corner stress, and under-BGA residue formed a multifactor failure condition.

Why this case matters

BGA interfacial fracture should not automatically be labeled black pad. Bulk and fracture-surface chemistry, nickel morphology, intermetallic thickness, joint location, and assembly stress must be integrated.

Full evidence reserved for MEMBER and STOREThe complete case includes the evidence sequence, four interpreted figures, alternative explanations, limitations, and practical application guidance.