
Case 296 ยท Public preview
Chloride Residue Can Attack Copper Exposed by Plating Blisters
Gold-plated connector contacts developed localized corrosion after assembly.
MicrosectioningSEMEDSElemental mappingPlating-thickness measurementFailed-control comparison

What the evidence preview establishes
Residual chloride from assembly flux was the primary corrosion driver. Blistering at the nickel-to-copper interface provided rupture sites that exposed the copper base alloy, creating local sources for copper-rich corrosion products.
Why this case matters
Do not infer inadequate plating thickness solely from substrate elements in a surface spectrum. Section the finish, inspect for interfacial blistering, map exposed base metal, and control ionic cleanliness after assembly.
Full evidence reserved for MEMBER and STOREThe complete case includes the evidence sequence, four interpreted figures, alternative explanations, limitations, and practical application guidance.