Thermal Damage Can Create the Electrolyte for Connector Migration

What the evidence preview establishes

Localized overheating around one pin damaged chlorinated potting material and created a corrosive ionic environment. With voltage applied, copper, nickel, and gold species migrated from the damaged pin toward the adjacent pin, producing the leakage path.

Why this case matters

When leakage develops near a thermally damaged connector pin, examine the surrounding polymer as part of the electrical system. Heat can release ionic species that transform potting material into a migration-supporting environment.