Case 1636 ยท Public preview
Similar MLCC Leakage Can Arise from Different Physical Defects
Three board-mounted MLCCs exhibited excessive leakage, while their placement near a damaged breakout edge initially suggested a common flex-cracking mechanism.
Electrical testingOptical microscopyMicrosectioningSEMComparative examination
What the evidence preview establishes
The capacitors did not share one failure mechanism. One failed through board-flexure cracks associated with breakout stress; two others most likely leaked through as-fabricated porosity that shortened migration paths between opposing nickel electrodes.
Why this case matters
Do not assign a common cause solely because components share a symptom and board location. Microsection each device far enough to separate assembly-induced flex damage from latent dielectric or electrode defects.
Full evidence reserved for MEMBER and STOREThe complete case includes the evidence sequence, four interpreted figures, alternative explanations, limitations, and practical application guidance.