Concurrent Capacitor Shorts Can Reveal a System-Level Electrical Event

What the evidence preview establishes

The concurrent failures and distributed internal damage supported a high-voltage transient or possible reverse-bias event affecting the capacitor array. The evidence did not support moisture contamination as the primary mechanism despite the failure occurring after humidity testing.

Why this case matters

Multiple simultaneous capacitor failures should be treated as a system event. Population-wide leakage, distributed internal damage, and rapid venting can support transient overstress even when the initiating arc site is no longer observable.