Transient Overvoltage Can Produce Localized Breakdown in a Polymer Tantalum Capacitor

What the evidence preview establishes

A localized fused region of tantalum and tantalum oxide identified dielectric breakdown within the slug. The evidence favored transient overvoltage followed by excessive current damage, with no repeated fabrication defect or polymer-cathode anomaly.

Why this case matters

Separate the initiating dielectric breakdown from the much larger secondary burn damage. A control device and high-magnification examination of the fused region can prevent a new material system from being blamed without evidence.