Case 2639 ยท Public preview
An Ionic Shunt Across a Diode Die Can Produce Leakage and Failure
Several transient-voltage-suppression diodes exhibited abnormal leakage or low-resistance behavior across multiple production periods.
Electrical testingChemical decapsulationSEMEDSElemental mappingFailed-control comparison
What the evidence preview establishes
The failures were most consistent with electrochemical migration creating an ionic shunt across the die. Related alloy and residue conditions on unused devices indicated an as-fabricated susceptibility rather than application overheating alone.
Why this case matters
Compare failed and unused devices, then evaluate alloy extension, residue, moisture, delamination, and cleanliness together.
Full evidence reserved for MEMBER and STOREThe complete case includes the evidence sequence, four interpreted figures, alternative explanations, limitations, and practical application guidance.