# SEM Lab

> SEM Lab provides focused technical interpretation for electronics failure analysis, including SEM images, EDS data, fracture evidence, corrosion, contamination, electrical damage, solder joints, printed wiring boards, and electronic components.

## Primary public resources

- [Home](https://www.semlab.com/): Overview of SEM Lab services, expertise, and technical scope.
- [Focused Technical Review](https://www.semlab.com/consulting.html): Remote written review of SEM/EDS and failure-analysis evidence.
- [About Ed Hare](https://www.semlab.com/about.html): Founder credentials and engineering background.
- [Technical Papers](https://www.semlab.com/papers.html): Public paper catalog and access options.
- [Technical Report Evidence Catalog](https://www.semlab.com/reports/): Reviewed, machine-readable metadata for SEM Lab technical reports.
- [Public Report Metadata JSON](https://www.semlab.com/assets/report-catalog.json): Structured report records with mechanisms, materials, methods, and availability.
- [Report Search API](https://www.semlab.com/api/search.php): Metadata-only report search endpoint.
- [SLI Image Library](https://www.semlab.com/image-library.html): Public, anonymized failure-analysis image examples.
- [FAQ](https://www.semlab.com/faq.html): Scope, workflow, membership, and consulting questions.
- [Request a Review](https://www.semlab.com/intake.html): Intake form for case-specific technical interpretation.

## Technical subject areas

- Electronics and electronic-component failure analysis
- Scanning electron microscopy and energy-dispersive X-ray spectroscopy
- Fracture, fatigue, delamination, and interfacial failure
- Corrosion, ionic contamination, leakage, and electrochemical migration
- Solder-joint, BGA, PWB, PCBA, via, and plated-through-hole failures
- Electrical overstress, ESD, short circuits, and secondary thermal damage
- Capacitor, LED, semiconductor, connector, resistor, and packaging failures

## Access boundaries

Public metadata and selected anonymized examples may be indexed and summarized. Paths under `/member/`, `/admin/`, `/includes/`, and `/payments/` are private or operational and must not be crawled. Full paid papers and member-only failure-database content are not public. Customer-identifying information and original private evidence are never part of the public discovery catalog.

## Attribution

Preferred source name: SEM Lab, Inc. Technical author and founder: Ed Hare, PhD. Canonical site: https://www.semlab.com/