Edward W. Hare, Ph.D., SEM Lab, Inc. – Papers and Technical Presentations
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2007 Failure Analysis of BGAs, Ed Hare Ph.D.
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2007 Diffusion Barrier Plating in Electronics, Ed Hare Ph.D.
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2004 Failure Analysis of LEDs, Ed Hare Ph.D.
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2004 Gold Embrittlement of Solder Joints, Ed Hare Ph.D.
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2004 Images of Failures in Microelectronics Packaging, IMAPS NW Chapter – Technical Seminar, February 11, 2004.
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2000 “Applications of Scanning Electron Microscopy (SEM) and Energy Dispersive Spectroscopy (EDS) in Failure Analysis in Electronics Manufacturing”, SAMPE NW Chapter meeting, September 26, 2000.
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1996 “Thermosonic Bonding as an Alternative to Soldering Fine Pitch”, SMTA NW Chapter Meeting, January 18, 1996.
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1995 “Stress Relaxation Behavior of Eutectic Tin-Lead Solder”, Journal of Electronic Materials, October 1995.
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1994 “Stress Relaxation Behavior of Eutectic Tin-Lead Solder with Silver and Copper Additions”, Ph.D. Dissertation, University of Washington, 1994.
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1993 “The Effect of Ag Additions on the Stress Relaxation Behavior of Eutectic Tin-Lead Solder”, TMS Annual Meeting, Denver, CO, 1993.
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1990 “Electrical Resistivity-Constitution Relationships in Ti-Fe and Ti-Ni Alloys”, Journal of Materials Science: Materials in Electronics, Vol. 1, 1990, pp 25-29.
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1989 “Solders and Soldering in the Electronics Industry”, International Society of Hybrid Microelectronics – Student Chapter Meeting, University of Washington.
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1988 “Creep Rupture Failure of Solder Joints”, Microelectronics Interconnect Conference – International Society of Hybrid Microelectronics, Bellingham, WA.
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1987 “11-mil Pitch Assembly Processes for High Density Electronic Modules”, International Society of Hybrid Microelectronics – NW Chapter Meeting, Vancouver, BC.
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1986 “Structure and Property Changes During Room Temperature Aging of Bismuth Solders”, Electronic Packaging: Materials and Processes, ASM Press, 1986, pp. 109-115.