Breakdown site in a Ta Capacitor

SEM image of the microsection of Ta Capacitor. The primary failure site is associated with the edge of the slug near the lead attachment at the cathode.

Leave a Reply

Your email address will not be published. Required fields are marked *

You may use these HTML tags and attributes:

<a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <s> <strike> <strong>

The reCAPTCHA verification period has expired. Please reload the page.