Fracture
Open Via Barrel Crack
A circumferential barrel crack in a multilayer PWB via, useful as a clean open-via reference tied directly to fabrication-related weaknesses.
Interpretation
Why this image matters
This is a useful reference for multilayer-board open failures because the governing structural feature is clearly visible and tied to the electrical symptom.
The report concluded that the vias were open due to circumferential barrel cracks near the center layers of the PWB and linked the cracking to drilled-hole quality and plated-copper thickness.
That makes the image especially helpful for showing when a via failure should be interpreted as a fabrication-quality problem rather than a downstream handling issue.
Best comparison value
- Teaching open-via mechanisms in multilayer PWBs
- Discussing drilled-hole and plated-copper quality issues
- Comparing structural via cracking to contamination or overstress symptoms