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Standardized ENIG quality reports from SEM/EDS ZAF results.

TOOL_1

ENIG Au Thickness and wt%P Report

Paste your 20 KeV area scan ENIG ZAF analysis results and receive a standardized report of immersion-gold thickness and wt%P in the electroless nickel-phosphorus layer. The report gives SEM/EDS analysts, material quality engineers, and board fabricators a consistent process-control metric for ENIG surface finish quality.

Submit analysis ENIG analysis note Plating method note

What You Get

Per-use access $20 per TOOL_1 run
Input Pasted ENIG ZAF SEM/EDS quant table
Report Au thickness, wt%P, filtered data, residuals, contamination notes

Built for repeatable ENIG process monitoring from routine SEM/EDS measurements.

SEM Lab Reference Population

See whether your ENIG result is ordinary, marginal, or unusual.

TOOL_1 reports are backed by SEM Lab's accepted historical ENIG SEM/EDS reference set. A submitted spectrum can be compared with prior ENIG measurements for immersion-gold thickness, wt%P in the electroless nickel-phosphorus layer, and surface contamination burden.

Current preliminary reference set: 22 accepted ENIG spectra. Median Au thickness is 0.137 microns (5.4 micro-inches), median Ni-P phosphorus is 8.46 wt%, and median non-fit element burden is 14.2 wt%. Use the comparison as a screening context, then review against the governing drawing, purchase specification, or IPC requirement.

n=22 accepted SEM Lab ENIG spectra
5.4 uin median calculated Au thickness
8.46% median phosphorus in Ni-P

Submit Analysis

Paste ENIG ZAF results

Use the quantification table exported or copied from your SEM/EDS software. Columns such as Formula, Element, mass%, wt%, and Atom% are accepted.

Pay to unlock TOOL_1 One $20 payment unlocks one calculation run.

TOOL_1 job

TOOL_1 evaluates the ENIG stack as immersion gold over electroless nickel-phosphorus on copper and uses Au, Ni, and P as the fitting elements. The method reports Au thickness and wt%P; it does not report electroless nickel-phosphorus layer thickness because the electron beam does not penetrate through the full layer.

Elements outside Au, Ni, and P are retained so the standardized report can include contamination and substrate-related notes.

Interpretation

Use the flags as a prompt for review, not as a final diagnosis.

TOOL_1 is intended for repeatable ENIG quality tracking, not one-off guesswork. The standardized report compares measured and predicted Au, Ni, and P, calculates wt%P from the measured Ni/P partition, and flags elements outside the ENIG fit.

Full EDS quant table Au | NiP | Cu preset Au thickness wt%P in Ni-P Measured vs predicted residuals Contamination accounting