TOOL_1

ENIG Au and NiP Thickness Fit

Paste your ENIG ZAF analysis results and receive a standardized report of immersion-gold thickness and wt%P in the electroless nickel layer. The report gives SEM/EDS analysts, material quality engineers, and board fabricators a consistent process-control metric for ENIG surface finish quality.

Submit analysis ENIG analysis note Plating method note

What You Get

Per-use access $20 per TOOL_1 run

Input Pasted ENIG ZAF SEM/EDS quant table

Report Au thickness, wt%P, filtered data, residuals, contamination notes

Built for repeatable ENIG process monitoring from routine SEM/EDS measurements.

Submit Analysis

Paste ENIG ZAF results

Use the quantification table exported or copied from your SEM/EDS software. Columns such as Formula, Element, mass%, wt%, and Atom% are accepted.

Pay to unlock TOOL_1 One $20 payment unlocks one calculation run.

Name

TOOL_1 job

TOOL_1 evaluates the ENIG stack as Au over Ni-P over Cu and uses Au, Ni, and P as the fitting elements.

Sample description / traceability

Paste ZAF/EDS quant table

Elements outside Au, Ni, and P are retained so the standardized report can include contamination and substrate-related notes.

Job Status

Status Not submitted

Job ID -

Au thickness -

NiP thickness -

Submit a paid TOOL_1 job to receive the fitted report.

TOOL_1 submissions are processed by SEM Lab to produce a standardized ENIG quality report.

Interpretation

Use the flags as a prompt for review, not as a final diagnosis.

TOOL_1 is intended for repeatable ENIG quality tracking, not one-off guesswork. The standardized report compares measured and predicted Au, Ni, and P, calculates wt%P from the measured Ni/P partition, and flags elements outside the ENIG fit.

Full EDS quant table Au | NiP | Cu preset Au thickness wt%P in Ni-P Measured vs predicted residuals Contamination accounting